Aging Test for USB Adapter

Why we need to perform aging test for power adapter?
When producing switching power adapters  in bulk, it is difficult to perform quality control according to process requirements due to the inevitable variations in raw materials, auxiliary materials, related process conditions, and equipment status, especially when human errors cannot be avoided. Such potential defects in manufacturing processes and designs often lead to premature failure of some USB adapters , whose stability and service life are much lower than the average service life of the batch. Reliability screening is an effective technical measure to ensure that these early failures are eliminated from the batch of switching power adapters before use, thus making the products put into use have a higher level of reliability.

Reliability screening is a non-destructive test whose screening should not affect the failure mechanism and failure distribution of a batch of power supplies but rather has an “aging” or “burn-in” effect. Therefore, it is also called “aging test.” The significance of reliability screening is particularly important in universal adapter or charger products.

Obviously, reliability screening requires a certain cost, such as increased cost and prolonged production cycle. However, compared with the cost caused by the discovery and replacement of early failure power supplies during installation, debugging, and on-site use, the cost is negligible. Especially for high-reliability engineering or cutting-edge systems such as aviation and aerospace, it is of great significance.

Reliability screening has the following characteristics:
For products that are defect-free and perform well, it is a non-destructive test. For products with potential defects, the test should induce their failure. For switching power adapters with potential defects, general testing methods cannot eliminate them. Only by applying certain stress to them to activate these potential defects and cause the power supply to fail can they be eliminated.
Screening must be conducted on 100% of the products, and the screening level is determined based on the lifespan requirements and actual working conditions of the products.
Screening can only improve the use reliability of products but cannot improve the inherent reliability of products. Since the reliability of switching power adapters is determined by the design, manufacturing process, and performance of raw materials, screening cannot improve the design, process, and material performance of switching power adapters. Screening aims to improve the reliability of power adapters超级链接https://www.apstechgroup.com/12v-1-5a-18w-switching-power-adapter-laptop-tablet-pc-power-supply-ac-dc-adapter-product/ by eliminating early failure products.
 
How to conduct Aging test?
Aging tests are crucial in ensuring the quality and reliability of products over time. In the electronic industry, aging tests are used to determine how an electronic device performs in the long run, especially under various environmental conditions. In this article, we will discuss the most common methods used for electronic aging tests.

High-temperature aging: This method subjects the device under test (DUT) to high temperatures (often above the operating temperature limit of the device), in order to simulate extreme operating conditions. The DUT is usually placed in an environmental chamber to control the temperature and humidity during testing.

Low-temperature aging: This method involves subjecting the DUT to low temperatures (often below the operating temperature limit) to simulate harsh environmental conditions, such as extremely cold climates. The DUT is also placed in an environmental chamber to control the temperature and humidity.

Thermal cycling: This method subjects the DUT to rapid and repeated temperature changes to simulate the stress on the device caused by thermal expansion and contraction. The DUT is usually placed in a temperature chamber that can quickly change the temperature from high to low, and vice versa.

Humidity testing: This method exposes the DUT to high humidity levels to test how it performs under such conditions. The DUT is either placed in an environmental chamber with controlled humidity levels or in a humidity chamber that can rapidly change the humidity levels.

Vibration testing: This method simulates the stress on the DUT caused by vibrations and shocks, which can occur during shipping or other handling. The DUT is usually placed on a vibration table that can simulate various vibration frequencies and amplitudes.

In conclusion, aging tests are essential for ensuring the quality and reliability of electronic products. By using different methods to simulate various environmental conditions, manufacturers can better understand how their products perform over time and make necessary improvements to their design.